Name: Stimulated Raman Scattering Microscopy: Techniques and Applications (en Inglés)
Price: 653201.00 COP
Availability: InStock
Author: Cheng Ji-Xin,Min Wei,Ozeki Yasuyuki
ISBN: 9780323851589

portada Stimulated Raman Scattering Microscopy: Techniques and Applications (en Inglés)

Formato

Libro Físico

Editorial

Elsevier

Autor

Cheng Ji-Xin,Min Wei,Ozeki Yasuyuki

Idioma

Inglés

N° páginas

610

Encuadernación

Tapa Blanda

ISBN13

9780323851589

N° edición

Stimulated Raman Scattering Microscopy: Techniques and Applications (en Inglés)

Cheng Ji-Xin,Min Wei,Ozeki Yasuyuki (Autor) · Elsevier · Tapa Blanda

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Reseña del libro "Stimulated Raman Scattering Microscopy: Techniques and Applications (en Inglés)"

Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers.