Name: Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes (en Inglés)
Price: 487226.00 COP
Availability: InStock
Author: Zhang, Pei
ISBN: 9783319346168

portada Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes (en Inglés)

Formato

Libro Físico

Autor

Pei Zhang

Editorial

Springer

Idioma

Inglés

N° páginas

118

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 0.7 cm

Peso

0.20 kg.

ISBN13

9783319346168

Categorías

Electricidad, electromagnetismo y magnetismo
Física nuclear
Física matemática

Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes (en Inglés)

Pei Zhang (Autor) · Springer · Tapa Blanda

Libro Nuevo

$ 487.226

$ 974.453

Ahorras: $ 487.226

50% descuento

Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

Se enviará desde nuestra bodega entre el Martes 23 de Julio y el Jueves 01 de Agosto.

Lo recibirás en cualquier lugar de Colombia entre 1 y 5 días hábiles luego del envío.

Reseña del libro "Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes (en Inglés)"

An energetic charged particle beam introduced to an rf cavity excites a wakefield therein. This wakefield can be decomposed into a series of higher order modes and multipoles, which for sufficiently small beam offsets are dominated by the dipole component. This work focuses on using these dipole modes to detect the beam position in third harmonic superconducting S-band cavities for light source applications. A rigorous examination of several means of analysing the beam position based on signals radiated to higher order modes ports is presented. Experimental results indicate a position resolution, based on this technique, of 20 microns over a complete module of 4 cavities. Methods are also indicated for improving the resolution and for applying this method to other cavity configurations. This work is distinguished by its clarity and potential for application to several other international facilities. The material is presented in a didactic style and is recommended both for students new to the field, and for scientists well-versed in the field of rf diagnostics.