Name: Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (en Inglés)
Price: 418791.00 COP
Availability: InStock
Author: Erni, Rolf
ISBN: 9781848165366

portada Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (en Inglés)

Formato

Libro Físico

Autor

Rolf Erni

Editorial

Imperial College Press

Idioma

Inglés

N° páginas

348

Encuadernación

Tapa Dura

Dimensiones

24.9 x 16.8 x 2.0 cm

Peso

0.77 kg.

ISBN

9781848165366

ISBN13

9781848165366

Categorías

Equipamiento, experimentos y técnicas científicas
Nanociencias
Nanotecnología

Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (en Inglés)

Rolf Erni (Autor) · Imperial College Press · Tapa Dura

Libro Físico

$ 418.791

$ 697.985

Ahorras: $ 279.194

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Origen: Reino Unido (Costos de importación incluídos en el precio)

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Reseña del libro "Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (en Inglés)"

This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.